SCANSTA112SM/NOPB

Product Overview

Category: Integrated Circuit (IC)

Use: The SCANSTA112SM/NOPB is a versatile IC used for scan-based testing and debugging of digital systems. It provides efficient and reliable test access to various components within a system, enabling comprehensive testing and diagnosis.

Characteristics: - High-speed operation - Low power consumption - Compact size - Easy integration into existing systems

Package: The SCANSTA112SM/NOPB is available in a small outline package (SOP) format, which ensures easy handling and compatibility with standard PCB designs.

Essence: The essence of the SCANSTA112SM/NOPB lies in its ability to facilitate efficient testing and debugging of complex digital systems, thereby improving overall system reliability and reducing time-to-market.

Packaging/Quantity: The SCANSTA112SM/NOPB is typically packaged in reels or tubes, with each reel/tube containing a specific quantity of ICs. The exact packaging and quantity may vary depending on the supplier.

Specifications

The SCANSTA112SM/NOPB offers the following specifications:

• Operating Voltage: 2.5V - 3.6V
• Maximum Clock Frequency: 50 MHz
• Number of Test Channels: 112
• Test Data Width: 1 bit per channel
• Input/Output Voltage Levels: CMOS/TTL compatible
• Temperature Range: -40°C to +85°C

Detailed Pin Configuration

The SCANSTA112SM/NOPB features a pin configuration that enables seamless integration into digital systems. The detailed pin configuration is as follows:

1. VCC: Power supply voltage
2. GND: Ground reference
3. TCK: Test clock input
4. TMS: Test mode select input
5. TDI: Test data input
6. TDO: Test data output
7. TRST: Test reset input
8. TCKEN: Test clock enable input
9. TDIEN: Test data input enable input
10. TDOEN: Test data output enable input
11. TESTEN: Test enable input 12-113. SCAN[0:111]: Individual scan test channels
12. SCANOUT: Scan test output

Functional Features

The SCANSTA112SM/NOPB offers the following functional features:

1. Scan-Based Testing: Enables efficient testing of digital systems by providing access to internal components through scan chains.
2. Boundary Scan: Supports IEEE 1149.1 standard for boundary scan testing, allowing for comprehensive testing and diagnosis of system interconnects.
3. Built-in Self-Test (BIST): Includes built-in self-test capabilities, enabling the execution of self-diagnostic routines within the IC itself.
4. JTAG Interface: Provides a standardized interface for easy integration with existing JTAG-based testing infrastructure.
5. Multiple Test Channels: Offers 112 test channels, allowing simultaneous testing of multiple components within a system.

Advantages and Disadvantages

Advantages: - Efficient and reliable testing of digital systems - Compact size and easy integration - Support for industry-standard testing methodologies - High-speed operation for quick testing cycles - Low power consumption for energy-efficient testing

Disadvantages: - Limited number of test channels compared to some alternative models - May require additional support circuitry for certain applications - Relatively higher cost compared to simpler testing solutions

Working Principles

The SCANSTA112SM/NOPB operates based on the principles of scan-based testing and boundary scan. It utilizes scan chains to provide test access to internal components within a digital system. By shifting test patterns into these scan chains, the IC can efficiently test and diagnose the system's functionality.

During testing, the IC captures test data from the system's internal components and outputs it through the TDO pin. This data can then be analyzed to identify any faults or errors within the system.

Detailed Application Field Plans

The SCANSTA112SM/NOPB finds applications in various fields, including:

1. Semiconductor Manufacturing: Used during the production testing of integrated circuits to ensure their quality and functionality.
2. Embedded Systems: Enables efficient testing and debugging of complex digital systems used in embedded applications such as automotive electronics, industrial control systems, and consumer electronics.
3. Telecommunications: Facilitates testing of digital communication systems, ensuring reliable operation and minimizing downtime.
4. Aerospace and Defense: Supports testing and diagnosis of critical digital systems used in aerospace and defense applications, ensuring their reliability and safety.

Alternative Models

For users seeking alternative options, the following models offer similar functionality to the SCANSTA112SM/NOPB:

1. SCANSTA114SM/NOPB: Similar to the SCANSTA112SM/NOPB but offers 114 test channels instead of 112.
2. SCANSTA110SM/NOPB: Provides a lower number of test